Showing results 1 to 5 of 5
Accelerated Life Tests for Products of Unequal Size Bai, Do Sun; h.j. yun, IEEE TRANSACTIONS ON RELIABILITY, v.45, no.4, pp.611 - 618, 1996 |
Comparisons of optimal accelerated test plans for estimating quantiles of lifetime distribution at the use condition Park, JI; Yum, Bong-Jin, ENGINEERING OPTIMIZATION, v.31, no.3, pp.301 - 328, 1999 |
Design of accelerated life tests under cyclic-stress loading = 주기적인 스트레스 하에서 가속 수명 시험의 설계link Kim, Seung-Hyun; 김승현; et al, 한국과학기술원, 2011 |
Design of Failure-censored Accelerated Life Test Sampling Plans for Lognormal and Weibull Distributions Bai, Do Sun; j. g. kim; y. r. chun, ENGINEERING OPTIMIZATION, v.21, no.2, pp.197 - 212, 1993 |
Time-Censored Ramp Test with Stress Bound for Weibull Lifetime Distribution Bai, Do Sun; y. r. chun; m.s. cha, IEEE TRANSACTIONS ON RELIABILITY, v.46, no.1, pp.99 - 107, 1997 |
Discover