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Microstructural investigation of SexTe100-x thin films deposited on Si(100) substrates by x-ray diffractometer and transmission electron Microscopy analysis

Kim, ET; Lee, JeongYong; Kim, YT, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, v.46, pp.7392 - 7395, 2007-11

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