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Effects of Thickness and Crystallographic Orientation on Tensile Properties of Thinned Silicon Wafers Lee, Sangmin; Kim, Jae-Han; Kim, Young Suk; Ohba, Takayuki; Kim, Taek-Soo, IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, v.10, no.2, pp.1 - 1, 2020-02 |
Orientation and thickness dependence of magnetic levitation force and trapped magnetic field of single grain YBa2Cu3O7-y bulk superconductors Jung, Y.; Go, S. J.; Joo, H. T.; Lee, Y. J.; Park, S. -D.; Jun, B. -H.; Kim, C. -J., PROGRESS IN SUPERCONDUCTIVITY AND CRYOGENICS, v.19, no.1, pp.30 - 35, 2017-03 |
Origin of residual stress and its relationship with crystallographic orientation of sputtered thin films = 스퍼터링법으로 증착한 박막의 잔류응력 생성 원인 및 결정 방향성과의 관계link Choi, Han-Mei; 최한메; et al, 한국과학기술원, 1999 |
유기금속화학증착법으로 증착된 (Ba,Sr)$TiO_3$ 박막의 투과전자현미경연구 = A transmission electron microscopy study on (Ba,Sr)$TiO_3$ thin films deposited by metal-organic chemical vapor depositionlink 유동철; Yoo, Dong-Chul; et al, 한국과학기술원, 2000 |
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