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Showing results 13 to 16 of 16

13
Role of postannealing temperature on the microstructure of Al2O3/ZnO thin films grown by atomic layer deposition for TFT applications

Jang, Yong-Woon; Bang, Seok-Hwan; Jeon, Hyeong-Tag; Lee, Jeong-Yong, PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, v.207, no.9, pp.2185 - 2189, 2010-09

14
Study on the Photoresponse of Amorphous In-Ga-Zn-O and Zinc Oxynitride Semiconductor Devices by the Extraction of Sub-Gap-State Distribution and Device Simulation

Jang, Jun Tae; Park, Jozeph; Ahn, Byung Du; Kim, Dong Myong; Choi, Sung-Jin; Kim, Hyun-Suk; Kim, Dae Hwan, ACS APPLIED MATERIALS & INTERFACES, v.7, no.28, pp.15570 - 15577, 2015-07

15
Sub-Bandgap Photonic Capacitance-Voltage Method for Characterization of the Interface Traps in Low Temperature Poly-Silicon Thin-Film Transistors

Hwang, Jun Seok; Bae, Hagyoul; Lee, Jungmin; Choi, Sung-Jin; Kim, Dae Hwan; Kim, Dong Myong, IEEE ELECTRON DEVICE LETTERS, v.36, no.4, pp.339 - 341, 2015-04

16
Water-Mediated Photochemical Treatments for Low-Temperature Passivation of Metal-Oxide Thin-Film Transistors

Heo, Jae Sang; Jo, Jeong-Wan; Kang, Jingu; Jeong, Chan-Yong; Jeong, Hu Young; Kim, Sung Kyu; Kim, Kwanpyo; et al, ACS APPLIED MATERIALS & INTERFACES, v.8, no.16, pp.10403 - 10412, 2016-04

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