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Showing results 31261 to 31280 of 100496

31261
Electrical breakdown of the positive temperature coefficient of resistivity barium titnate ceramics

Kim, Ho Gi, JOURNAL OF MATERIALS RESEARCH, v.11, no.8, pp.2002 - 2008, 1996-01

31262
Electrical Breakdown of the PTCR Barium Titanate Ceramics

Kim, Ho Gi, 1995-01

31263
Electrical cell-substrate impedance sensing as a non-invasive tool for cancer cell study

Hong J.; Kandasamy K.; Marimuthu M.; Choi C.S.; Kim S., ANALYST, v.136, no.2, pp.237 - 245, 2011

31264
Electrical characteristics and detailed interfacial structures of Ag/Ni metallization on polycrystalline thermoelectric SnSe

Kim, Yeongseon; Jin, Younghwan; Yoon, Giwan; Chung, In; Yoon, Hana; Yoo, Chung-Yul; Park, Sang Hyun, JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY, v.35, no.5, pp.711 - 718, 2019-05

31265
Electrical Characteristics and Thermally Induced Metastability in an Amorphous silicon Ambipolar Transistor

J.Jang; H.Y. Chu; Choochon Lee, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.36, no.12, pp.2928 - 2934, 1989-12

31266
ELECTRICAL CHARACTERISTICS OF (100), (111), AND RANDOMLY ALIGNED LEAD-ZIRCONATE-TITANATE THIN-FILMS

Kim, Chang Jung; Yoon, Dae Sung; Lee, Joon Sung; Choi, Chaun Gi; Lee, Won-Jong; No, Kwangsoo, JOURNAL OF APPLIED PHYSICS, v.76, no.11, pp.7478 - 7482, 1994-12

31267
Electrical characteristics of (Pb,Sr)TiO3 thin films for ultra-large-scale-integrated dynamic random access memory capacitors prepared by liquid-source misted chemical deposition

Chung, HJ; Woo, Seong-Ihl, JOURNAL OF VACUUM SCIENCE TECHNOLOGY B, v.19, no.1, pp.275 - 280, 2001-01

31268
ELECTRICAL CHARACTERISTICS OF CARBON-DOPED GAAS

Choochon Lee, JOURNAL OF MATERIALS SCIENCE LETTERS, v.12, no.16, pp.1251 - 1252, 1993

31269
Electrical characteristics of helicon wave plasmas

Yun, SM; Kim, JH; Chang, Hong-Young, IEEE TRANSACTIONS ON PLASMA SCIENCE, v.26, no.2, pp.159 - 166, 1998-04

31270
Electrical characteristics of hierarchical conductive pathways in cementitious composites incorporating CNT and carbon fiber

Kim, G. M.; Park, S. M.; Ryu, G. U.; Lee, Haeng-Ki, Cement and Concrete Composites, v.82, pp.165 - 175, 2017-09

31271
Electrical characterization of 2D and 3D microelectrodes for achieving high-resolution sensing in retinal prostheses with in vitro animal experimental results

Ko, Hyoungho; Lee, Sangmin, MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS, v.23, no.2, pp.473 - 481, 2017-02

31272
Electrical characterization of dense and porous nanocrystalline Gd-doped ceria electrolytes

Jo, Seung Hwan; Muralidharan, P.; Kim, Do Kyung, SOLID STATE IONICS, v.178, no.39-40, pp.1990 - 1997, 2008-03

31273
Electrical Characterization of Metal-Insulator-Semiconductor Capacitors Having Double-Layered Atomic-Layer-Deposited Al2O3 and ZnO for Transparent Thin Film Transistor Applications

Yoon, Sung-Min; Park, Sang-Hee Ko; Byun, Chun-Won; Yang, Shin-Hyuk; Hwang, Chi-Sun, JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.157, no.7, pp.727 - 733, 2010

31274
Electrical Characterization of n/p-Type Nickel Silicide/Silicon Junctions by Sb Segregation

Jun, Myungsim; Park, Youngsam; Hyun, Younghoon; Choi, Sung-Jin; Jang, Moongyu; Zyung, Taehyung, JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.11, no.8, pp.7339 - 7342, 2011

31275
Electrical characterization of PLT thin films by LP-MOCVD

Lee, SS; Kim, Ho-Gi, INTEGRATED FERROELECTRICS, v.11, no.1-4, pp.137 - 144, 1995-11

31276
Electrical Characterization of Screen-Printed Circuits on the Fabric

Kim, Yongsang; Kim, Hyejung; Yoo, Hoi-Jun, IEEE TRANSACTIONS ON ADVANCED PACKAGING, v.33, pp.196 - 205, 2010-02

31277
Electrical circuit model for quantifying the proliferation resistance of nuclear fuel cycles

Ko, WI; Kim, HD; Yang, MS; Park, HS; Lee, Kun Jai, ANNALS OF NUCLEAR ENERGY, v.27, no.15, pp.1399 - 1425, 2000-10

31278
Electrical conductance change of graphene-based devices upon surface modification for detecting botulinum neurotoxin

Kim, Daehee; Kim, Ho-Jong; Shim, Seung-Bo; Jung, Suyong; Lee, Nam Hee; Nahm, Seung Hoon; Shin, Eui-Cheol; et al, JAPANESE JOURNAL OF APPLIED PHYSICS, v.56, no.6, 2017-06

31279
Electrical Conduction and Defect Structure in SrTiO3 Thick Film

Y.H. Kim; H.G. Kim, 한국세라믹학회지, v.27, no.32, pp.841 - 850, 1990

31280
Electrical Conduction Mechanism of RuO2 Based Thick Film Resistor

김호기, 한국세라믹학회지, v.31, no.12, pp.1529 - 1529, 1994-01

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