Browse by Title
Showing results 196521 to 196540 of 279500
| Test particle simulations for transport in toroidal plasmas = 토로이달 플라즈마의 수송에 대한 시험입자 시늉내기link Park, Hyoung-Bin; 박형빈; Choi, Duk-In; Jin, Gyo-Tag; et al, 한국과학기술원, 1998 |
| Test Particle Simulations in a Tokamak Choi, Duk In, Asia Pacific Plasma Theory Conference, 1997 |
| Test pattern clustering for fast and accurate lithography modeling = 빠르고 정확한 리소그래피 모델링을 위한 테스트 패턴 클러스터링link Cho, Gangmin; Shin, Youngsoo; et al, 한국과학기술원, 2021 |
| Test pattern extraction for lithography modeling under design rule revisions Cho, Gangmin; Kwon, Yonghwi; Kareem, Pervaiz; Kim Sungho; Shin, Youngsoo, Conference on Optical Microlithography XXXIV, SPIE, 2021-02-21 |
| Test Pattern Generation for the Functional Test of Logic Networks hong, w.m.; Cho, Jung Wan, JOURNAL OF KIEE, v.13, no.3, pp.1 - 6, 1976-07 |
| Test Pattern Generation of Combinational Circuits using Logic Decision Diagrams Lim, Jong-Tae; Lee, MS, ISIM 2000, pp.375 - 378, 2000-10 |
| Test Sequence Generation for Adaptive Interoperability Testing Kang, Sungwon; Kim, Myungchul, IFIP TC6/WG6.1 The 8th International Workshop on Protocol Test Systems (IWPTS'95), pp.193 - 206, 1995-09 |
| Test sequence generation from modechart specification = Modechart 명세 기반의 실시간 시스템 테스트 시퀀스 생성link Lee, Nam-Hee; 이남희; et al, 한국과학기술원, 1998 |
| Test sequence generation from specification in system description language = 시스템 기술 언어로 된 규격으로 부터의 시험 계열 생성 기법link Chin, Byoung-Moon; 진병문; et al, 한국과학기술원, 1996 |
| Test Set Diameter: Quantifying the Diversity of Sets of Test Cases Feldt, Robert; Poulding, Simon; Clark, David; Yoo, Shin, 9th IEEE International Conference on Software Testing, Verification and Validation, ICST 2016, pp.223 - 233, Institute of Electrical and Electronics Engineers Inc., 2016-04-14 |
| Test statistics of composite-signal detectors in purely-additive noise Son,Jae Cheol; Song, lickho; Park Yang Soo; Kim, Ji Hoon; Chang Jae Joo, KITE JOURNAL OF ELECTRONICS ENGINEERING, v.1, no.1, pp.1 - 5, 1990-04 |
| Test Time Elongation of the Shock Tube Using Driver Gas Staging Valve Kim, Keunyeong; Jeong, Junho; PARK, GISU, The 34th International Symposium on Shock Waves, National Symposium on Shock Waves Korea, 2023-07-17 |
| Test-time adaptation for automatic speech recognition via sequential-level generalized entropy minimization = 문장 수준의 일반화된 엔트로피 최소화를 통한 음성 인식 모델에 대한 테스트타임 적응link Kim, Changhun; 김창훈; et al, 한국과학기술원, 2024 |
| Test-Time Adaptation in the Dynamic World With Compound Domain Knowledge Management Song, Junha; Park, Kwanyong; Shin, Inkyu; Woo, Sanghyun; Zhang, Chaoning; Kweon, In So, IEEE ROBOTICS AND AUTOMATION LETTERS, v.8, no.11, pp.7583 - 7590, 2023-11 |
| Test-Time Adaptation via Self-Training with Nearest Neighbor Information Jang, Minguk; Chung, Sae-Young; Chung, Hye Won, The International Conference on Learning Representations, ICLR 2023, The International Conference on Learning Representations (ICLR), 2023-05-01 |
| Test-time augmentation methods for image classification and robustness to common noise via image resolution modification = 영상의 해상도 조정을 이용한 영상 인식 성능과 영상 오염에의 강인함을 향상시키는 시험 시간에서의 데이터 증강 방법 연구link Eun, Jung; Kim, Junmo; et al, 한국과학기술원, 2022 |
| Test-Time Self-Adaptive Small Language Models for Question Answering Jeong, Soyeong; Baek, Jinheon; Cho, Sukmin; Hwang, Sung Ju; Park, Jong-Cheol, The 2023 Conference on Empirical Methods in Natural Language Processing, Association for Computational Linguistics (ACL), 2023-12-07 |
| Test-Time Style Shifting: Handling Arbitrary Styles in Domain Generalization Park, JungWuk; Han, Dong Jun; Kim, Soyeong; Moon, Jaekyun, 40th International Conference on Machine Learning, ICML 2023, pp.27114 - 27131, ML Research Press, 2023-07-26 |
| Test-Time Synthetic-to-Real Adaptive Depth Estimation Yi, Eojindl; Kim, Junmo, 2023 IEEE International Conference on Robotics and Automation, ICRA 2023, pp.4938 - 4944, Institute of Electrical and Electronics Engineers Inc., 2023-05-28 |
| Test-Time Synthetic-to-Real Adaptive Depth Estimation Yi, Eojindl; Kim, Junmo, 2023 IEEE International Conference on Robotics and Automation, ICRA 2023, pp.4938 - 4944, IEEE, 2023-05-29 |
Discover
Type
Open Access
Date issued
- 34,332 2020 - 2024
- 100,102 2010 - 2019
- 75,680 2000 - 2009
- 44,727 1990 - 1999
- 14,360 1980 - 1989
- 62 1964 - 1969