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Eletrothermal analysis of poly-si nanowire and its application to localized annealing of gate-all-around field-effect transistor = 폴리실리콘 나노와이어의 전기적, 열적 특성분석 및 이를 바탕으로 한 트랜지스터에의 응용link Park, Jun-Young; 박준영; et al, 한국과학기술원, 2016 |
Self-Curable Gate-All-Around MOSFETs Using Electrical Annealing to Repair Degradation Induced From Hot-Carrier Injection Park, Jun-Young; Moon, Dong-Il; Seol, Myeong-Lok; Kim, Choong-Ki; Jeon, Chang-Hoon; Bae, Hagyoul; Bang, Tewook; et al, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.63, no.3, pp.910 - 915, 2016-03 |
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