Showing results 11 to 12 of 12
Reliability Improvement of Gate-All-Around Junctionless SONOS Memory by Joule Heat From Inherent Nanowire Current Lee, Jung-Woo; Han, Joon-Kyu; Kim, Myung-Su; Yu, Ji-Man; Jung, Jin-Woo; Yun, Seong-Yun; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.69, no.11, pp.6133 - 6138, 2022-11 |
TFTR DT experiments Strachan, JD; Batha, S; Beer, M; Bell, MG; Bell, RE; Belov, A; Berk, H; et al, PLASMA PHYSICS AND CONTROLLED FUSION, v.39, pp.103 - 114, 1997-12 |
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