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Showing results 78141 to 78160 of 279157

78141
Electrical Characteristics of Single/Coupled Stripline on Meshed Ground Plane in High-speed Package

Kim, Joungho; Lee, Heeseok, International Symposium on Electronic Materials and Packagings, pp.19 - 22, 2001

78142
Electrical Characteristics of SrTiO3 Thin Film Prepared by RF Magnetron Sputtering on Si wafer

김호기, The Korean Ceramic Soc., Spring meeting, KAIST, 1991

78143
Electrical Characteristics of the Dual Frequency Capacitively Coupled Plasma(CCP)

Jeon B.I.; Chang, Hong-Young; Shon J., IEEE International Conference on Plasma Science, 2003, pp.423 -, IEEE, 2003-06-02

78144
Electrical characterization and neuromorphic application of 3-dimensional semiconductor devices = 3차원 구조 반도체 소자의 전기적 특성과 뉴로모픽 소자로의 응용link

Kim, Seong-Yeon; Choi, Yang-Kyu; et al, 한국과학기술원, 2020

78145
Electrical characterization of 2D and 3D microelectrodes for achieving high-resolution sensing in retinal prostheses with in vitro animal experimental results

Ko, Hyoungho; Lee, Sangmin, MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS, v.23, no.2, pp.473 - 481, 2017-02

78146
Electrical characterization of bump-less high speed channel on silicon, organic and glass interposer

Lee, Hyunsuk; Kim, Hee-Gon; Kim, Kiyeong; Jung, Daniel Hyunsuk; Kim, Jonghoon J; Choi, Sumin; Lim, Jaemin; et al, 2014 IEEE International Symposium on Electromagnetic Compatibility, EMC 2014, pp.850 - 854, Institute of Electrical and Electronics Engineers Inc., 2014-08

78147
Electrical characterization of dense and porous nanocrystalline Gd-doped ceria electrolytes

Jo, Seung Hwan; Muralidharan, P.; Kim, Do Kyung, SOLID STATE IONICS, v.178, no.39-40, pp.1990 - 1997, 2008-03

78148
Electrical characterization of dense and porous nanocrystalline Gd-doped ceria electrolytes

Jo, Seung Hwan; Muralidharan, P.; Kim, Do Kyung, Solid State Ionics, pp.1990 - 1997, Elsevier, 2008

78149
Electrical characterization of interface property in Pt/(Ba, Sr)$TiO_3$/Pt structure for DRAM storage capacitor = DRAM 저장용 캐패시터를 위한 Pt/(Ba,Sr)$TiO_3$/Pt 구조에서의 계면의 전기적 특성 평가link

Kwak, Dong-Hwa; 곽동화; et al, 한국과학기술원, 1998

78150
Electrical Characterization of Metal-Insulator-Semiconductor Capacitors Having Double-Layered Atomic-Layer-Deposited Al2O3 and ZnO for Transparent Thin Film Transistor Applications

Yoon, Sung-Min; Park, Sang-Hee Ko; Byun, Chun-Won; Yang, Shin-Hyuk; Hwang, Chi-Sun, JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.157, no.7, pp.727 - 733, 2010

78151
Electrical Characterization of n/p-Type Nickel Silicide/Silicon Junctions by Sb Segregation

Jun, Myungsim; Park, Youngsam; Hyun, Younghoon; Choi, Sung-Jin; Jang, Moongyu; Zyung, Taehyung, JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.11, no.8, pp.7339 - 7342, 2011

78152
Electrical Characterization of Nanoscale Au/TiO2 Schottky Diodes Probed with Conductive Atomic Force Microscopy

Lee, Hyunsoo; Van, Trong Nghia; Park, JeongYoung, 한국진공학회 제 45회 하계학술대회, 한국진공학회, 2013-08-23

78153
Electrical Characterization of Nanoscale Au/TiO2 Schottky Diodes Probed with Conductive Atomic Force Microscopy

이현수; Lee, Young keun; Bae, Saebyuk; 박정영, 한국물리학회 2014년 봄 학술논문발표회 및 정기총회, 한국물리학회, 2014-04-24

78154
Electrical Characterization of PLT thin films by LP-MOCVD

Kim, Ho Gi, Int. Sym. on Integ. Ferro., 1995-01-01

78155
Electrical characterization of PLT thin films by LP-MOCVD

Lee, SS; Kim, Ho-Gi, INTEGRATED FERROELECTRICS, v.11, no.1-4, pp.137 - 144, 1995-11

78156
Electrical characterization of printed circuits on the fabric = 직물형 인쇄 회로 기판의 전기적 특성 연구link

Kim, Yong-Sang; 김용상; et al, 한국과학기술원, 2008

78157
Electrical Characterization of Screen-Printed Circuits on the Fabric

Kim, Yongsang; Kim, Hyejung; Yoo, Hoi-Jun, IEEE TRANSACTIONS ON ADVANCED PACKAGING, v.33, pp.196 - 205, 2010-02

78158
Electrical characterization of Trough Silicon Via (TSV) depending on structural and material parameters based on 3D full wave simulation

Pak, J.S.; Ryu, C.; Kim, Joungho, International Conference on Electronic Materials and Packaging, EMAP 2007, IEEE, 2007-11-19

78159
Electrical characterization of wafer-bonded interfaces of p+InGaAs/n+InGaAs and p+GaAs/n+InGaAs

Geum, Dae-Myeong; Kim, Seongkwang; Lim, Hyeongrak; Park, Juhyuk; Jeong, Jaeyong; Han, JaeHoon; Choi, WonJun; et al, Global Photovoltaic Conference 2021, Korea Photovoltaic Society (KPVS), 2021-07-07

78160
Electrical circuit model for quantifying the proliferation resistance of nuclear fuel cycles

Ko, WI; Kim, HD; Yang, MS; Park, HS; Lee, Kun Jai, ANNALS OF NUCLEAR ENERGY, v.27, no.15, pp.1399 - 1425, 2000-10

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