DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Hong-Yun | ko |
dc.contributor.author | Yu, Chang-Hyo | ko |
dc.contributor.author | Kim, Lee-Sup | ko |
dc.date.accessioned | 2013-03-11T17:39:44Z | - |
dc.date.available | 2013-03-11T17:39:44Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2011-09 | - |
dc.identifier.citation | IEEE TRANSACTIONS ON VISUALIZATION AND COMPUTER GRAPHICS, v.17, no.9, pp.1286 - 1294 | - |
dc.identifier.issn | 1077-2626 | - |
dc.identifier.uri | http://hdl.handle.net/10203/99757 | - |
dc.description.abstract | The Unified Early Z-Test (U-EZT) is proposed to examine the visibility of pixels during tile-based rasterization in a mobile 3D graphics processor. U-EZT combines the advantages of the Z-max and Z-min EZT algorithms: the Z-max algorithm is improved by the independently updatable z-max tiles and the use of mask bits; and the Z-min algorithm is improved by reusing the mask bits from the z-max test to update the z-min tiles after tile rasterizing. As a result, storage requirements are reduced to 3 bits per pixel, and simulations suggest that U-EZT requires 20 percent to 57 percent less memory bandwidth than previous EZT algorithms. | - |
dc.language | English | - |
dc.publisher | IEEE COMPUTER SOC | - |
dc.subject | HARDWARE | - |
dc.title | A Memory-Efficient Unified Early Z-Test | - |
dc.type | Article | - |
dc.identifier.wosid | 000293455600009 | - |
dc.identifier.scopusid | 2-s2.0-79960359511 | - |
dc.type.rims | ART | - |
dc.citation.volume | 17 | - |
dc.citation.issue | 9 | - |
dc.citation.beginningpage | 1286 | - |
dc.citation.endingpage | 1294 | - |
dc.citation.publicationname | IEEE TRANSACTIONS ON VISUALIZATION AND COMPUTER GRAPHICS | - |
dc.contributor.localauthor | Kim, Lee-Sup | - |
dc.contributor.nonIdAuthor | Yu, Chang-Hyo | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordAuthor | Computer graphics | - |
dc.subject.keywordAuthor | graphics processors | - |
dc.subject.keywordAuthor | visible line/surface algorithms | - |
dc.subject.keywordAuthor | z-test | - |
dc.subject.keywordPlus | HARDWARE | - |
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