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Atomic Force Microscopy Studies of Charge Transport Properties of Strained and Indented Topological Insulator Hwang, Jin Heui; Kwon, Sangku; Park, J; Lee, J; Lyeo, Ho-Ki; Park, JeongYoung, AVS 60th International Symposium & Exhibition, American Vacuum Society, 2013-10-29 |
Surface Plasmon Induced Enhancement of Hot Electron Flow Probed with Metal-Semiconductor Nanodiodes Jung, CH; Park, J; Park, JeongYoung, Nano Korea 2011 Symposium, 2011-08-26 |
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