Formation identification of Y2BaCuO5 and BaCeO3 in MOCVD-processed YBCO films with Ce doping

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dc.contributor.authorKim, Younghako
dc.contributor.authorKim, CJko
dc.contributor.authorJun, BHko
dc.contributor.authorSung, THko
dc.contributor.authorHan, YHko
dc.contributor.authorHan, SCko
dc.contributor.authorNo, Kwangsooko
dc.date.accessioned2013-03-11T11:01:56Z-
dc.date.available2013-03-11T11:01:56Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2009-06-
dc.identifier.citationSUPERCONDUCTOR SCIENCE & TECHNOLOGY, v.22-
dc.identifier.issn0953-2048-
dc.identifier.urihttp://hdl.handle.net/10203/99091-
dc.description.abstractThe influence of nanosized secondary particles, such as those produced via rare-earth doping for example, on magnetic-field-induced flux motion in YBa2Cu3O7-delta (YBCO)-coated conductors has been investigated. In this study, we investigated the influence of Ce doping on nanosized secondary phase formation in YBCO films. Ce-doped YBCO films on single SrTiO3 crystals were prepared viametal-organic chemical vapor deposition (MOCVD). For the first time, a Y2BaCuO5 (Y211) secondary phase was observed in the Ce-doped YBCO film, while the pure YBCO film contained only a Y2O3 secondary phase. As Ce doping concentration increased to 3 wt%, a BaCeO3 secondary phase developed. This was due to the low solubility limit of Ce for Y in the MOCVD YBCO film. Additionally, outgrowths on the Ce-doped YBCO film surfaces and defect structures, such as a-axis grains, were examined.-
dc.languageEnglish-
dc.publisherIOP PUBLISHING LTD-
dc.subjectCHEMICAL-VAPOR-DEPOSITION-
dc.subjectCRITICAL-CURRENT DENSITY-
dc.subjectYBA2CU3O7-X THIN-FILMS-
dc.subjectCOATED CONDUCTORS-
dc.subjectENHANCEMENT-
dc.subjectGROWTH-
dc.subjectMICROSTRUCTURE-
dc.subjectSUPERCONDUCTOR-
dc.subjectDEPENDENCE-
dc.titleFormation identification of Y2BaCuO5 and BaCeO3 in MOCVD-processed YBCO films with Ce doping-
dc.typeArticle-
dc.identifier.wosid000266219400024-
dc.identifier.scopusid2-s2.0-68249124605-
dc.type.rimsART-
dc.citation.volume22-
dc.citation.publicationnameSUPERCONDUCTOR SCIENCE & TECHNOLOGY-
dc.identifier.doi10.1088/0953-2048/22/6/065010-
dc.contributor.localauthorNo, Kwangsoo-
dc.contributor.nonIdAuthorKim, CJ-
dc.contributor.nonIdAuthorJun, BH-
dc.contributor.nonIdAuthorSung, TH-
dc.contributor.nonIdAuthorHan, YH-
dc.contributor.nonIdAuthorHan, SC-
dc.type.journalArticleArticle-
dc.subject.keywordPlusCHEMICAL-VAPOR-DEPOSITION-
dc.subject.keywordPlusCRITICAL-CURRENT DENSITY-
dc.subject.keywordPlusYBA2CU3O7-X THIN-FILMS-
dc.subject.keywordPlusCOATED CONDUCTORS-
dc.subject.keywordPlusENHANCEMENT-
dc.subject.keywordPlusGROWTH-
dc.subject.keywordPlusMICROSTRUCTURE-
dc.subject.keywordPlusSUPERCONDUCTOR-
dc.subject.keywordPlusDEPENDENCE-
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