Subsurface Incorporation of Co Atoms into Si(100)

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The initial adsorption structures of Co on Si(100) were investigated using scanning tunneling microscopy (STM). Filled-state STM images showed bright protrusions at Si dimers. Density functional theory calculations demonstrated that Co atoms at subsurface interstitial sites beneath Si dimers are the most stable. Simulated STM images confirmed that the bright features observed at Si dimers were due to Co atoms incorporated at subsurface interstitial sites.
Publisher
AMER CHEMICAL SOC
Issue Date
2011-08
Language
English
Article Type
Article
Keywords

SCANNING TUNNELING MICROSCOPE; ULTRASOFT PSEUDOPOTENTIALS; METAL SILICIDES; GROWTH; SURFACES; SILICON; SI(001)

Citation

JOURNAL OF PHYSICAL CHEMISTRY C, v.115, no.31, pp.15467 - 15470

ISSN
1932-7447
URI
http://hdl.handle.net/10203/97772
Appears in Collection
CH-Journal Papers(저널논문)
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