DC Field | Value | Language |
---|---|---|
dc.contributor.author | Cho, Jeonghyeon | ko |
dc.contributor.author | Song, Eak-Hwan | ko |
dc.contributor.author | Kim, Hee-Gon | ko |
dc.contributor.author | Ahn, Seung-Young | ko |
dc.contributor.author | Pak, Jun-So | ko |
dc.contributor.author | Kim, Ji-Seong | ko |
dc.contributor.author | Kim, Joung-Ho | ko |
dc.date.accessioned | 2013-03-09T02:16:22Z | - |
dc.date.available | 2013-03-09T02:16:22Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2011-08 | - |
dc.identifier.citation | IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, v.53, no.3, pp.814 - 822 | - |
dc.identifier.issn | 0018-9375 | - |
dc.identifier.uri | http://hdl.handle.net/10203/95098 | - |
dc.description.abstract | The mixed-mode ABCD parameters are newly introduced and developed, where the definition and the connection are carefully established to have both the advantages of the mixed-mode S-parameters and the ABCD parameters, simultaneously. In addition, closed-form equations to model symmetric and asymmetric coupled transmission lines are derived. With the derived equations, the voltage transfer functions and the eye diagram of a variety of printed circuit board (PCB)-level differential interconnects are analytically attainable, which greatly enhances their applicability for signal integrity analysis. To verify the derived equations and to validate the proposed mixed-mode ABCD parameters, a series of microstrip-type differential lines on PCB test vehicles were fabricated and tested. The effectiveness of the proposed mixed-mode ABCD parameters was successfully confirmed through the comparison studies, in particular for the case of mode-conversion occurrence at the differential lines. | - |
dc.language | English | - |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
dc.subject | COUPLED TRANSMISSION-LINES | - |
dc.subject | SCATTERING PARAMETERS | - |
dc.title | Mixed-Mode ABCD Parameters: Theory and Application to Signal Integrity Analysis of PCB-Level Differential Interconnects | - |
dc.type | Article | - |
dc.identifier.wosid | 000294131700030 | - |
dc.identifier.scopusid | 2-s2.0-80052055602 | - |
dc.type.rims | ART | - |
dc.citation.volume | 53 | - |
dc.citation.issue | 3 | - |
dc.citation.beginningpage | 814 | - |
dc.citation.endingpage | 822 | - |
dc.citation.publicationname | IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY | - |
dc.contributor.localauthor | Ahn, Seung-Young | - |
dc.contributor.localauthor | Kim, Joung-Ho | - |
dc.contributor.nonIdAuthor | Song, Eak-Hwan | - |
dc.contributor.nonIdAuthor | Kim, Hee-Gon | - |
dc.contributor.nonIdAuthor | Pak, Jun-So | - |
dc.contributor.nonIdAuthor | Kim, Ji-Seong | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordAuthor | Differential interconnect | - |
dc.subject.keywordAuthor | eye diagram | - |
dc.subject.keywordAuthor | mixed-mode ABCD parameters | - |
dc.subject.keywordAuthor | printed circuit board (PCB) | - |
dc.subject.keywordAuthor | signal integrity | - |
dc.subject.keywordAuthor | transfer function | - |
dc.subject.keywordPlus | COUPLED TRANSMISSION-LINES | - |
dc.subject.keywordPlus | SCATTERING PARAMETERS | - |
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