Analysis of Repairable System Using Reliability Graph with General Gates
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Goh, Gyoung Tae | ko |
| dc.contributor.author | Shin, Seung Ki | ko |
| dc.contributor.author | Seong, Poong-Hyun | ko |
| dc.date.accessioned | 2013-03-09T00:34:59Z | - |
| dc.date.available | 2013-03-09T00:34:59Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2009-11 | - |
| dc.identifier.citation | TRANSACTIONS OF THE AMERICAN NUCLEAR SOCIETY, v.101, pp.529 - 530 | - |
| dc.identifier.issn | 0003-018x | - |
| dc.identifier.uri | http://hdl.handle.net/10203/94826 | - |
| dc.language | English | - |
| dc.publisher | American Nuclear Society | - |
| dc.title | Analysis of Repairable System Using Reliability Graph with General Gates | - |
| dc.type | Article | - |
| dc.type.rims | ART | - |
| dc.citation.volume | 101 | - |
| dc.citation.beginningpage | 529 | - |
| dc.citation.endingpage | 530 | - |
| dc.citation.publicationname | TRANSACTIONS OF THE AMERICAN NUCLEAR SOCIETY | - |
| dc.contributor.localauthor | Seong, Poong-Hyun | - |
| dc.contributor.nonIdAuthor | Goh, Gyoung Tae | - |
| dc.contributor.nonIdAuthor | Shin, Seung Ki | - |
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