Origin of surface potential change during ferroelectric switching in epitaxial PbTiO3 thin films studied by scanning force microscopy

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We investigated the surface potential of the ferroelectric domains of the epitaxial PbTiO3 (PTO) films using both Kelvin probe and piezoresponse force microscopy. The surface potential changes as a function of applied biases suggested that the amount and sign of surface potentials depend on the correlation between polarization and screen charges. It also suggested that the trapped negative charges exist on the as-deposited PTO surfaces. Injected charges and their resultant surface potentials are investigated by grounded tip scans. The results unveiled the origin of surface potential changes during ferroelectric switching in the epitaxial PTO films.
Publisher
AMER INST PHYSICS
Issue Date
2009-01
Language
English
Article Type
Article
Keywords

PROBE MICROSCOPY; SRBI2TA2O9

Citation

APPLIED PHYSICS LETTERS, v.94, no.3, pp.300 - 305

ISSN
0003-6951
DOI
10.1063/1.3046786
URI
http://hdl.handle.net/10203/93872
Appears in Collection
MS-Journal Papers(저널논문)
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