The Analysis of Memory Margin of an Alternative Current-Plasma Display Panel with K-Ion-Doped MgO

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An ac-type plasma display panel (ac-PDP) with K ion-doped MgO film formed via a sol-gel precursor was analyzed and compared to an ac-type PDP with MgO formed by e-beam evaporation. As the dopant content was increased, memory margins of test panels were linearly reduced and the surface charging caused by the secondary electron emission (SEE) was decreased. From these results we suggested the amounts of surface charging has a close relation to the wall potential of ac-PDP.
Publisher
TAYLOR & FRANCIS LTD
Issue Date
2009
Language
English
Article Type
Article
Keywords

SECONDARY-ELECTRON YIELD; SURFACE; CENTERS

Citation

MOLECULAR CRYSTALS AND LIQUID CRYSTALS, v.499, pp.612 - 619

ISSN
1542-1406
DOI
10.1080/15421400802619628
URI
http://hdl.handle.net/10203/93442
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