Quantitative evaluations of a high-voltage multiscan CCD camera

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dc.contributor.authorKim, YMko
dc.contributor.authorLee, JeongYongko
dc.contributor.authorMoonen, Dko
dc.contributor.authorJang, KIko
dc.contributor.authorKim, YJko
dc.date.accessioned2013-03-08T11:32:23Z-
dc.date.available2013-03-08T11:32:23Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2007-12-
dc.identifier.citationJOURNAL OF ELECTRON MICROSCOPY, v.56, pp.217 - 224-
dc.identifier.issn0022-0744-
dc.identifier.urihttp://hdl.handle.net/10203/92914-
dc.description.abstractElectron detection characteristics such as modulation transfer function (MTF), detection quantum efficiency (DQE), dynamic range, linearity, average gain, and uniformity of a high-voltage multiscan CCD (HV-MSC, 1K x 1K pixels) camera were evaluated. This camera was used as a major recording medium in a high-voltage electron microscope (HVEM) installed at the Korea Basic Science Institute (KBSI). In spite of the high energy of the incident electrons, the overall properties of the HV-MSC camera were comparable to other CCD cameras for a low-voltage electron microscope (LVEM). In order to take full advantages of the properties of the HV-MSC camera for atomic resolution electron microscopy, we discuss optimal experimental conditions based on the detection properties.-
dc.languageEnglish-
dc.publisherOXFORD UNIV PRESS-
dc.subjectELECTRON DETECTION CHARACTERISTICS-
dc.subjectMICROSCOPY-
dc.subjectEFFICIENCY-
dc.subjectFILM-
dc.titleQuantitative evaluations of a high-voltage multiscan CCD camera-
dc.typeArticle-
dc.identifier.wosid000251988600002-
dc.identifier.scopusid2-s2.0-37549009892-
dc.type.rimsART-
dc.citation.volume56-
dc.citation.beginningpage217-
dc.citation.endingpage224-
dc.citation.publicationnameJOURNAL OF ELECTRON MICROSCOPY-
dc.identifier.doi10.1093/jmicro/dfm029-
dc.contributor.localauthorLee, JeongYong-
dc.contributor.nonIdAuthorKim, YM-
dc.contributor.nonIdAuthorMoonen, D-
dc.contributor.nonIdAuthorJang, KI-
dc.contributor.nonIdAuthorKim, YJ-
dc.type.journalArticleArticle-
dc.subject.keywordAuthorHV-MSC camera-
dc.subject.keywordAuthorCCD detector-
dc.subject.keywordAuthorelectron detection-
dc.subject.keywordAuthorhigh voltage-
dc.subject.keywordAuthorHVEM-
dc.subject.keywordPlusELECTRON DETECTION CHARACTERISTICS-
dc.subject.keywordPlusMICROSCOPY-
dc.subject.keywordPlusEFFICIENCY-
dc.subject.keywordPlusFILM-
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