DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, YM | ko |
dc.contributor.author | Lee, JeongYong | ko |
dc.contributor.author | Moonen, D | ko |
dc.contributor.author | Jang, KI | ko |
dc.contributor.author | Kim, YJ | ko |
dc.date.accessioned | 2013-03-08T11:32:23Z | - |
dc.date.available | 2013-03-08T11:32:23Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2007-12 | - |
dc.identifier.citation | JOURNAL OF ELECTRON MICROSCOPY, v.56, pp.217 - 224 | - |
dc.identifier.issn | 0022-0744 | - |
dc.identifier.uri | http://hdl.handle.net/10203/92914 | - |
dc.description.abstract | Electron detection characteristics such as modulation transfer function (MTF), detection quantum efficiency (DQE), dynamic range, linearity, average gain, and uniformity of a high-voltage multiscan CCD (HV-MSC, 1K x 1K pixels) camera were evaluated. This camera was used as a major recording medium in a high-voltage electron microscope (HVEM) installed at the Korea Basic Science Institute (KBSI). In spite of the high energy of the incident electrons, the overall properties of the HV-MSC camera were comparable to other CCD cameras for a low-voltage electron microscope (LVEM). In order to take full advantages of the properties of the HV-MSC camera for atomic resolution electron microscopy, we discuss optimal experimental conditions based on the detection properties. | - |
dc.language | English | - |
dc.publisher | OXFORD UNIV PRESS | - |
dc.subject | ELECTRON DETECTION CHARACTERISTICS | - |
dc.subject | MICROSCOPY | - |
dc.subject | EFFICIENCY | - |
dc.subject | FILM | - |
dc.title | Quantitative evaluations of a high-voltage multiscan CCD camera | - |
dc.type | Article | - |
dc.identifier.wosid | 000251988600002 | - |
dc.identifier.scopusid | 2-s2.0-37549009892 | - |
dc.type.rims | ART | - |
dc.citation.volume | 56 | - |
dc.citation.beginningpage | 217 | - |
dc.citation.endingpage | 224 | - |
dc.citation.publicationname | JOURNAL OF ELECTRON MICROSCOPY | - |
dc.identifier.doi | 10.1093/jmicro/dfm029 | - |
dc.contributor.localauthor | Lee, JeongYong | - |
dc.contributor.nonIdAuthor | Kim, YM | - |
dc.contributor.nonIdAuthor | Moonen, D | - |
dc.contributor.nonIdAuthor | Jang, KI | - |
dc.contributor.nonIdAuthor | Kim, YJ | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordAuthor | HV-MSC camera | - |
dc.subject.keywordAuthor | CCD detector | - |
dc.subject.keywordAuthor | electron detection | - |
dc.subject.keywordAuthor | high voltage | - |
dc.subject.keywordAuthor | HVEM | - |
dc.subject.keywordPlus | ELECTRON DETECTION CHARACTERISTICS | - |
dc.subject.keywordPlus | MICROSCOPY | - |
dc.subject.keywordPlus | EFFICIENCY | - |
dc.subject.keywordPlus | FILM | - |
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