Computational study on the performance of multiple-gate nanowire schottky-barrier MOSFETs

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dc.contributor.authorShin, Mincheolko
dc.date.accessioned2013-03-08T05:41:49Z-
dc.date.available2013-03-08T05:41:49Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2008-03-
dc.identifier.citationIEEE TRANSACTIONS ON ELECTRON DEVICES, v.55, pp.737 - 742-
dc.identifier.issn0018-9383-
dc.identifier.urihttp://hdl.handle.net/10203/92248-
dc.description.abstractQuantum simulations of multiple-gate nanowire Schottky-barrier (SB) MOSFETs in the ballistic transport regime have been performed by self-consistently solving the nonequilibrium Green's function transport equation and the Poisson's equation. The device characteristics have been examined as the channel length of the nanowire SB-MOSFETs was aggressively reduced, and their scaling behaviors were compared to planar SB devices and also to devices with doped source/drain. The enhancement of the device performance due to the multiple-gate effects has been assessed quantitatively. A limited improvement of the OFF-state performance has been observed, whereas ON-state currents increase significantly despite the size quantization effect.-
dc.languageEnglish-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.subjectFIELD-EFFECT TRANSISTORS-
dc.subjectQUANTUM SIMULATION-
dc.subjectTUNNEL TRANSISTORS-
dc.subjectSOURCE/DRAIN-
dc.titleComputational study on the performance of multiple-gate nanowire schottky-barrier MOSFETs-
dc.typeArticle-
dc.identifier.wosid000253505800005-
dc.identifier.scopusid2-s2.0-40949116361-
dc.type.rimsART-
dc.citation.volume55-
dc.citation.beginningpage737-
dc.citation.endingpage742-
dc.citation.publicationnameIEEE TRANSACTIONS ON ELECTRON DEVICES-
dc.identifier.doi10.1109/TED.2008.916149-
dc.contributor.localauthorShin, Mincheol-
dc.type.journalArticleArticle-
dc.subject.keywordAuthormultiple gates-
dc.subject.keywordAuthornanowire transistors-
dc.subject.keywordAuthorSchottky-barrier (SB) MOSFETs-
dc.subject.keywordAuthorsemiconductor device modeling-
dc.subject.keywordPlusFIELD-EFFECT TRANSISTORS-
dc.subject.keywordPlusQUANTUM SIMULATION-
dc.subject.keywordPlusTUNNEL TRANSISTORS-
dc.subject.keywordPlusSOURCE/DRAIN-
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