Flow lines with regular service times: Evolution of delay, state dependent failures and semiconductor wafer fabrication
- Publisher
- IEEE
- Issue Date
- 2008-08-23
- Language
- English
- Citation
4th IEEE Conference on Automation Science and Engineering, CASE 2008, pp.247 - 252
- Appears in Collection
- IE-Conference Papers(학술회의논문)
- Files in This Item
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