DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lee, SangGap | ko |
dc.contributor.author | Won, Soon-Ho | ko |
dc.contributor.author | Saun, Seung Bo | ko |
dc.contributor.author | Lee, Soonchil | ko |
dc.date.accessioned | 2013-03-08T00:41:06Z | - |
dc.date.available | 2013-03-08T00:41:06Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2007-09 | - |
dc.identifier.citation | NANOTECHNOLOGY, v.18, no.37, pp.375505 | - |
dc.identifier.issn | 0957-4484 | - |
dc.identifier.uri | http://hdl.handle.net/10203/91622 | - |
dc.description.abstract | We describe a magnetic resonance force microscopy experiment carried out using both a fast- relaxing spin system and a frequency- modulation mode detection method, presenting a validation of the measured signal and sensitivity. The detection method applied along with a self- excited cantilever oscillation worked stably without any serious interference due to spurious cantilever excitation despite application of first- harmonic microwave modulation, and thereby successfully created almost the maximum available signal. The signal could be measured without distortion while the magnetic field was swept at a rate of 1.9 G s(-1). The measured sensitivity approached the thermal noise limit of the cantilever with a high quality factor. The experimental results for both signal and noise were in good agreement with theoretical predictions. | - |
dc.language | English | - |
dc.publisher | IOP PUBLISHING LTD | - |
dc.subject | ELECTRON-PARAMAGNETIC-RESONANCE | - |
dc.subject | SILICON | - |
dc.subject | CANTILEVERS | - |
dc.subject | DEFECTS | - |
dc.subject | SCALE | - |
dc.title | Magnetic resonance force microscopy in fast-relaxing spins using a frequency-modulation mode detection method | - |
dc.type | Article | - |
dc.identifier.wosid | 000249282900009 | - |
dc.identifier.scopusid | 2-s2.0-34548160234 | - |
dc.type.rims | ART | - |
dc.citation.volume | 18 | - |
dc.citation.issue | 37 | - |
dc.citation.beginningpage | 375505 | - |
dc.citation.publicationname | NANOTECHNOLOGY | - |
dc.identifier.doi | 10.1088/0957-4484/18/37/375505 | - |
dc.contributor.localauthor | Lee, Soonchil | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordPlus | ELECTRON-PARAMAGNETIC-RESONANCE | - |
dc.subject.keywordPlus | SILICON | - |
dc.subject.keywordPlus | CANTILEVERS | - |
dc.subject.keywordPlus | DEFECTS | - |
dc.subject.keywordPlus | SCALE | - |
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