Magnetic resonance force microscopy in fast-relaxing spins using a frequency-modulation mode detection method

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dc.contributor.authorLee, SangGapko
dc.contributor.authorWon, Soon-Hoko
dc.contributor.authorSaun, Seung Boko
dc.contributor.authorLee, Soonchilko
dc.date.accessioned2013-03-08T00:41:06Z-
dc.date.available2013-03-08T00:41:06Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2007-09-
dc.identifier.citationNANOTECHNOLOGY, v.18, no.37, pp.375505-
dc.identifier.issn0957-4484-
dc.identifier.urihttp://hdl.handle.net/10203/91622-
dc.description.abstractWe describe a magnetic resonance force microscopy experiment carried out using both a fast- relaxing spin system and a frequency- modulation mode detection method, presenting a validation of the measured signal and sensitivity. The detection method applied along with a self- excited cantilever oscillation worked stably without any serious interference due to spurious cantilever excitation despite application of first- harmonic microwave modulation, and thereby successfully created almost the maximum available signal. The signal could be measured without distortion while the magnetic field was swept at a rate of 1.9 G s(-1). The measured sensitivity approached the thermal noise limit of the cantilever with a high quality factor. The experimental results for both signal and noise were in good agreement with theoretical predictions.-
dc.languageEnglish-
dc.publisherIOP PUBLISHING LTD-
dc.subjectELECTRON-PARAMAGNETIC-RESONANCE-
dc.subjectSILICON-
dc.subjectCANTILEVERS-
dc.subjectDEFECTS-
dc.subjectSCALE-
dc.titleMagnetic resonance force microscopy in fast-relaxing spins using a frequency-modulation mode detection method-
dc.typeArticle-
dc.identifier.wosid000249282900009-
dc.identifier.scopusid2-s2.0-34548160234-
dc.type.rimsART-
dc.citation.volume18-
dc.citation.issue37-
dc.citation.beginningpage375505-
dc.citation.publicationnameNANOTECHNOLOGY-
dc.identifier.doi10.1088/0957-4484/18/37/375505-
dc.contributor.localauthorLee, Soonchil-
dc.type.journalArticleArticle-
dc.subject.keywordPlusELECTRON-PARAMAGNETIC-RESONANCE-
dc.subject.keywordPlusSILICON-
dc.subject.keywordPlusCANTILEVERS-
dc.subject.keywordPlusDEFECTS-
dc.subject.keywordPlusSCALE-
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