Transient bit error recovery scheme for ROM-based embedded systems
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Ryu, Sang-Moon | ko |
| dc.contributor.author | Park, Dong-Jo | ko |
| dc.date.accessioned | 2013-03-07T09:26:21Z | - |
| dc.date.available | 2013-03-07T09:26:21Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2005-09 | - |
| dc.identifier.citation | IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS, v.E88D, no.9, pp.2209 - 2212 | - |
| dc.identifier.issn | 0916-8532 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/89877 | - |
| dc.description.abstract | A new simple recovery scheme for transient bit errors in the RAM of a ROM-based embedded system is presented, which exploits the information stored in the ROM. And a new scrubbing technique suitable to the proposed recovery scheme is also presented. With the proposed recovery scheme and scrubbing technique, the reliability of the RAM against transient bit errors can be improved remarkably with no additional extra memory and scrubbing overhead. | - |
| dc.language | English | - |
| dc.publisher | IEICE-INST ELECTRONICS INFORMATION COMMUNICATIONS ENG | - |
| dc.subject | SINGLE EVENT UPSET | - |
| dc.subject | RELIABILITY | - |
| dc.title | Transient bit error recovery scheme for ROM-based embedded systems | - |
| dc.type | Article | - |
| dc.identifier.wosid | 000232082000026 | - |
| dc.identifier.scopusid | 2-s2.0-26444470843 | - |
| dc.type.rims | ART | - |
| dc.citation.volume | E88D | - |
| dc.citation.issue | 9 | - |
| dc.citation.beginningpage | 2209 | - |
| dc.citation.endingpage | 2212 | - |
| dc.citation.publicationname | IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS | - |
| dc.identifier.doi | 10.1093/ietisy/e88-d.9.2209 | - |
| dc.contributor.localauthor | Park, Dong-Jo | - |
| dc.contributor.nonIdAuthor | Ryu, Sang-Moon | - |
| dc.type.journalArticle | Article | - |
| dc.subject.keywordAuthor | transient bit error | - |
| dc.subject.keywordAuthor | memory scrubbing | - |
| dc.subject.keywordAuthor | reliability | - |
| dc.subject.keywordAuthor | embedded system | - |
| dc.subject.keywordPlus | SINGLE EVENT UPSET | - |
| dc.subject.keywordPlus | RELIABILITY | - |
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