DC Field | Value | Language |
---|---|---|
dc.contributor.author | Oh, JS | ko |
dc.contributor.author | Kim, Seung-Woo | ko |
dc.date.accessioned | 2013-03-07T09:14:23Z | - |
dc.date.available | 2013-03-07T09:14:23Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2005-10 | - |
dc.identifier.citation | OPTICS LETTERS, v.30, no.19, pp.2650 - 2652 | - |
dc.identifier.issn | 0146-9592 | - |
dc.identifier.uri | http://hdl.handle.net/10203/89852 | - |
dc.description.abstract | We discuss two ways to use femtosecond pulsed lasers as a new interferometric light source for enhanced precision surface-profile metrology. First, a train of ultrafast laser pulses yields repeated low temporal coherence, which allows unequal-path scanning interferometry, which is not feasible with white light, to be performed. Second, the high spatial coherence of femtosecond pulsed lasers enables large-sized optics to be tested in nonsymmetric configurations with relatively small-sized reference surfaces. These two advantages are verified experimentally with Fizeau and Twyman-Green type scanning interferometers. (c) 2005 Optical Society of America. | - |
dc.language | English | - |
dc.publisher | OPTICAL SOC AMER | - |
dc.title | Femtosecond laser pulses for surface-profile metrology | - |
dc.type | Article | - |
dc.identifier.wosid | 000232046700042 | - |
dc.identifier.scopusid | 2-s2.0-27744599683 | - |
dc.type.rims | ART | - |
dc.citation.volume | 30 | - |
dc.citation.issue | 19 | - |
dc.citation.beginningpage | 2650 | - |
dc.citation.endingpage | 2652 | - |
dc.citation.publicationname | OPTICS LETTERS | - |
dc.identifier.doi | 10.1364/OL.30.002650 | - |
dc.contributor.localauthor | Kim, Seung-Woo | - |
dc.contributor.nonIdAuthor | Oh, JS | - |
dc.description.isOpenAccess | N | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordPlus | FIZEAU INTERFEROMETER | - |
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