Solid-state lasers for frequency metrology
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kärtner, F.X | ko |
| dc.contributor.author | Mücke, O.D | ko |
| dc.contributor.author | Wagenblast, P | ko |
| dc.contributor.author | Ell, R | ko |
| dc.contributor.author | Winter, A | ko |
| dc.contributor.author | Kim, Jungwon | ko |
| dc.contributor.author | Siddiqui, A | ko |
| dc.contributor.author | Matos, L | ko |
| dc.date.accessioned | 2013-03-06T20:13:48Z | - |
| dc.date.available | 2013-03-06T20:13:48Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2005 | - |
| dc.identifier.citation | LEOS SUMMER TOPICAL MEETING, v.2005, no.0, pp.85 - 86 | - |
| dc.identifier.issn | 1099-4742 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/88298 | - |
| dc.description.abstract | The unique properties of solid-state laser materials such as ultrawide bandwidth and long upper-state lifetimes enable unique tools for frequency metrology. We report on recent progress in femtosecond laser frequency combs from octave-spanning Ti:sapphire lasers and single-frequency microchip lasers. ? 2005 IEEE. | - |
| dc.language | English | - |
| dc.publisher | Institute of Electrical and Electronics Engineers | - |
| dc.title | Solid-state lasers for frequency metrology | - |
| dc.type | Article | - |
| dc.identifier.scopusid | 2-s2.0-33748333276 | - |
| dc.type.rims | ART | - |
| dc.citation.volume | 2005 | - |
| dc.citation.issue | 0 | - |
| dc.citation.beginningpage | 85 | - |
| dc.citation.endingpage | 86 | - |
| dc.citation.publicationname | LEOS SUMMER TOPICAL MEETING | - |
| dc.contributor.localauthor | Kim, Jungwon | - |
| dc.contributor.nonIdAuthor | Kärtner, F.X | - |
| dc.contributor.nonIdAuthor | Mücke, O.D | - |
| dc.contributor.nonIdAuthor | Wagenblast, P | - |
| dc.contributor.nonIdAuthor | Ell, R | - |
| dc.contributor.nonIdAuthor | Winter, A | - |
| dc.contributor.nonIdAuthor | Siddiqui, A | - |
| dc.contributor.nonIdAuthor | Matos, L | - |
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