Minimizing leakage of sequential circuits through flip-flop skewing and technology mapping
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Sewan Heo | ko |
| dc.contributor.author | Youngsoo Shin | ko |
| dc.date.accessioned | 2013-03-06T19:36:10Z | - |
| dc.date.available | 2013-03-06T19:36:10Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2007-12 | - |
| dc.identifier.citation | JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE , v.15, no.7, pp.215 - 220 | - |
| dc.identifier.issn | 1598-1657 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/88181 | - |
| dc.language | English | - |
| dc.publisher | 대한전자공학회 | - |
| dc.title | Minimizing leakage of sequential circuits through flip-flop skewing and technology mapping | - |
| dc.type | Article | - |
| dc.type.rims | ART | - |
| dc.citation.volume | 15 | - |
| dc.citation.issue | 7 | - |
| dc.citation.beginningpage | 215 | - |
| dc.citation.endingpage | 220 | - |
| dc.citation.publicationname | JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE | - |
| dc.contributor.localauthor | Youngsoo Shin | - |
| dc.contributor.nonIdAuthor | Sewan Heo | - |
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