Fundamentals of Stress-Induced Diffusion: Theoretical Approach to Hydrogen Transport through Self-Stressed Electrode
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | s.-j. lee | ko |
| dc.contributor.author | s.-i. pyun | ko |
| dc.date.accessioned | 2013-03-06T17:01:18Z | - |
| dc.date.available | 2013-03-06T17:01:18Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2005 | - |
| dc.identifier.citation | 전기화학회지, v.8, pp.47 - 54 | - |
| dc.identifier.issn | 1229-1935 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/87696 | - |
| dc.language | Korean | - |
| dc.publisher | 한국전기화학회 | - |
| dc.title | Fundamentals of Stress-Induced Diffusion: Theoretical Approach to Hydrogen Transport through Self-Stressed Electrode | - |
| dc.type | Article | - |
| dc.type.rims | ART | - |
| dc.citation.volume | 8 | - |
| dc.citation.beginningpage | 47 | - |
| dc.citation.endingpage | 54 | - |
| dc.citation.publicationname | 전기화학회지 | - |
| dc.contributor.nonIdAuthor | s.-j. lee | - |
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