Existence of a Cu3Au-type ordered structure in CdxZn1-xTe epilayers grown on (100)GaAs substrates

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Selected area electron diffraction pattern (SADP) and transmission electron microscopy (TEM) measurements were carried out to investigate the spontaneously ordered structure in CdxZn1-xTe epilayers grown on GaAs (100) substrates. The SADP showed superstructure reflections with symmetrical intensity, and the high-resolution TEM (HRTEM) micrographs showed doublet periodicity in the contrast of the {100} lattice planes. The results of the SADP and the HRTEM measurements showed a Cu3Au-type ordered structure was formed in the Cd(x)Z(1-x)Te epilayer. The present results can help improve understanding of the Cu3Au-type ordered structures in CdxZn1-xTe epilayers grown on GaAs substrates. (c) 2005 Elsevier Ltd. All rights reserved.
Publisher
PERGAMON-ELSEVIER SCIENCE LTD
Issue Date
2006-01
Language
English
Article Type
Article
Keywords

VAPOR-PHASE EPITAXY

Citation

SOLID STATE COMMUNICATIONS, v.137, pp.70 - 73

ISSN
0038-1098
DOI
10.1016/j.ssc.2005.10.007
URI
http://hdl.handle.net/10203/87616
Appears in Collection
MS-Journal Papers(저널논문)
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