Polarized Raman confocal microscopy of single gallium nitride nanowires
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Pauzauskie P.J. | ko |
| dc.contributor.author | Talaga D. | ko |
| dc.contributor.author | Seo K. | ko |
| dc.contributor.author | Yang P. | ko |
| dc.contributor.author | Lagugne-Labarthet F. | ko |
| dc.date.accessioned | 2013-03-06T15:02:52Z | - |
| dc.date.available | 2013-03-06T15:02:52Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2005 | - |
| dc.identifier.citation | JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, v.127, no.49, pp.17146 - 17147 | - |
| dc.identifier.issn | 0002-7863 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/87346 | - |
| dc.language | English | - |
| dc.publisher | AMER CHEMICAL SOC | - |
| dc.subject | GAN | - |
| dc.subject | SCATTERING | - |
| dc.subject | SILICON | - |
| dc.title | Polarized Raman confocal microscopy of single gallium nitride nanowires | - |
| dc.type | Article | - |
| dc.identifier.wosid | 000233917500009 | - |
| dc.identifier.scopusid | 2-s2.0-29044442136 | - |
| dc.type.rims | ART | - |
| dc.citation.volume | 127 | - |
| dc.citation.issue | 49 | - |
| dc.citation.beginningpage | 17146 | - |
| dc.citation.endingpage | 17147 | - |
| dc.citation.publicationname | JOURNAL OF THE AMERICAN CHEMICAL SOCIETY | - |
| dc.identifier.doi | 10.1021/ja056006b | - |
| dc.contributor.localauthor | Seo K. | - |
| dc.contributor.nonIdAuthor | Pauzauskie P.J. | - |
| dc.contributor.nonIdAuthor | Talaga D. | - |
| dc.contributor.nonIdAuthor | Yang P. | - |
| dc.contributor.nonIdAuthor | Lagugne-Labarthet F. | - |
| dc.type.journalArticle | Article | - |
| dc.subject.keywordPlus | GAN | - |
| dc.subject.keywordPlus | SCATTERING | - |
| dc.subject.keywordPlus | SILICON | - |
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