DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kueck, AM | ko |
dc.contributor.author | Kim, Do Kyung | ko |
dc.contributor.author | Ramasse, QM | ko |
dc.contributor.author | De Jonghe, LC | ko |
dc.contributor.author | Ritchie, RO | ko |
dc.date.accessioned | 2013-03-06T13:13:39Z | - |
dc.date.available | 2013-03-06T13:13:39Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2008-09 | - |
dc.identifier.citation | NANO LETTERS, v.8, pp.2935 - 2939 | - |
dc.identifier.issn | 1530-6984 | - |
dc.identifier.uri | http://hdl.handle.net/10203/87074 | - |
dc.description.abstract | Ultrahigh-resolution transmission electron microscopy and atomic-scale spectroscopy are used to investigate the origin of the toughness in rare-earth doped silicon carbide (RE-SiC) by examining the mechanistic nature of the intergranular cracking events which we find to occur precisely along the RE-decorated interface between the SiC grains and the nanoscale grain-boundary phase. We conclude that, for optimal toughness, the relative elastic modulus across the grain-boundary phase and the interfacial fracture toughness are the most critical material parameters; both can be altered with judicious choice of rare-earth elements. | - |
dc.language | English | - |
dc.publisher | AMER CHEMICAL SOC | - |
dc.subject | TOUGHENED SILICON-CARBIDE | - |
dc.subject | FRACTURE-TOUGHNESS | - |
dc.subject | OXYNITRIDE GLASSES | - |
dc.subject | RESIDUAL-STRESS | - |
dc.subject | CERAMICS | - |
dc.subject | NITRIDE | - |
dc.subject | MICROSTRUCTURE | - |
dc.subject | COMPOSITES | - |
dc.subject | INTERFACE | - |
dc.subject | NANOCOMPOSITES | - |
dc.title | Atomic-resolution imaging of the nanoscale origin of toughness in rare-earth doped SiC | - |
dc.type | Article | - |
dc.identifier.wosid | 000259140200058 | - |
dc.identifier.scopusid | 2-s2.0-60449116558 | - |
dc.type.rims | ART | - |
dc.citation.volume | 8 | - |
dc.citation.beginningpage | 2935 | - |
dc.citation.endingpage | 2939 | - |
dc.citation.publicationname | NANO LETTERS | - |
dc.contributor.localauthor | Kim, Do Kyung | - |
dc.contributor.nonIdAuthor | Kueck, AM | - |
dc.contributor.nonIdAuthor | Ramasse, QM | - |
dc.contributor.nonIdAuthor | De Jonghe, LC | - |
dc.contributor.nonIdAuthor | Ritchie, RO | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordPlus | TOUGHENED SILICON-CARBIDE | - |
dc.subject.keywordPlus | FRACTURE-TOUGHNESS | - |
dc.subject.keywordPlus | OXYNITRIDE GLASSES | - |
dc.subject.keywordPlus | RESIDUAL-STRESS | - |
dc.subject.keywordPlus | CERAMICS | - |
dc.subject.keywordPlus | NITRIDE | - |
dc.subject.keywordPlus | MICROSTRUCTURE | - |
dc.subject.keywordPlus | COMPOSITES | - |
dc.subject.keywordPlus | INTERFACE | - |
dc.subject.keywordPlus | NANOCOMPOSITES | - |
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