DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lee, MY | ko |
dc.contributor.author | Lee, YS | ko |
dc.contributor.author | Lee, Hee Chul | ko |
dc.date.accessioned | 2013-03-06T12:23:57Z | - |
dc.date.available | 2013-03-06T12:23:57Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2005 | - |
dc.identifier.citation | JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS EXPRESS LETTERS, v.44, no.37-41, pp.1252 - 1255 | - |
dc.identifier.issn | 0021-4922 | - |
dc.identifier.uri | http://hdl.handle.net/10203/86975 | - |
dc.description.abstract | In this study, the effects of hydrazine treatment on the surface of H-CdTe were investigated by X-ray photoelectron spectropscopy (XPS) and metal-insulator-semi conductor (MIS) capacitance-voltage (C-V) analyses. By the XPS analysis, it was found that the Te4+ oxide peak at 576.2eV disappeared clearly from the surface of HgCdTe after hydrazine treatment. The hydrazine-treated sample showed a near-flatband condition, small hysteresis, and a high-frequency characteristic in C-V measurements. The photodiodes fabricated on hydrazine-treated HgCdTe showed dynamic resistance-area product values at zero bias (R(0)A) of similar to 2.54 Omega cm(2) for a junction area of 30 x 30 mu m(2), which are about ten times larger than those on Br-treated HgCdTe. | - |
dc.language | English | - |
dc.publisher | INST PURE APPLIED PHYSICS | - |
dc.subject | X-RAY PHOTOEMISSION | - |
dc.subject | ZNS | - |
dc.title | Effects of hydrazine surface treatment on HgCdTe long-wavelength infrared photodiodes | - |
dc.type | Article | - |
dc.identifier.wosid | 000232641900028 | - |
dc.identifier.scopusid | 2-s2.0-29144445697 | - |
dc.type.rims | ART | - |
dc.citation.volume | 44 | - |
dc.citation.issue | 37-41 | - |
dc.citation.beginningpage | 1252 | - |
dc.citation.endingpage | 1255 | - |
dc.citation.publicationname | JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS EXPRESS LETTERS | - |
dc.identifier.doi | 10.1143/JJAP.44.L1252 | - |
dc.contributor.localauthor | Lee, Hee Chul | - |
dc.contributor.nonIdAuthor | Lee, MY | - |
dc.contributor.nonIdAuthor | Lee, YS | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordAuthor | HgCdTe | - |
dc.subject.keywordAuthor | hydrazine | - |
dc.subject.keywordAuthor | Br-MeOH | - |
dc.subject.keywordAuthor | XPS | - |
dc.subject.keywordAuthor | C-V measurements | - |
dc.subject.keywordAuthor | Te4+ | - |
dc.subject.keywordAuthor | R(0)A | - |
dc.subject.keywordPlus | X-RAY PHOTOEMISSION | - |
dc.subject.keywordPlus | ZNS | - |
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