DC Field | Value | Language |
---|---|---|
dc.contributor.author | Sridharan, MG | ko |
dc.contributor.author | Mekaladevi, M | ko |
dc.contributor.author | Rodriguez-Viejo, J | ko |
dc.contributor.author | Narayandass, SK | ko |
dc.contributor.author | Mangalaraj, D | ko |
dc.contributor.author | Lee, Hee Chul | ko |
dc.date.accessioned | 2013-03-05T04:06:27Z | - |
dc.date.available | 2013-03-05T04:06:27Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2004-03 | - |
dc.identifier.citation | PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, v.201, pp.782 - 790 | - |
dc.identifier.issn | 0031-8965 | - |
dc.identifier.uri | http://hdl.handle.net/10203/85382 | - |
dc.description.abstract | The pseudodielectric-function spectra, epsilon(E) = epsilon(1)(E) + iepsilon(2)(E), of polycrystalline Cd0.9Zn0.1Te thin films in the 1.7-5.5 eV photon energy range were measured by spectroscopic ellipsometry. ne measured dielectric function spectra reveal distinct structures at energies of the E-1, E-1 + Delta(1) and E-2 critical points due to interband transitions. The vacuum evaporated Cd0.9Zn0.1Te thin films exhibited zinc-blende structure with predominant (111) orientation. The rms roughness of the film evaluated by an ex-situ atomic force microscopy is 3.7 nm. Dielectric related optical constants, determined from the spectroscopic ellipsometry data are presented and analyzed. The optical constants of the film were also determined by using optical transmittance measurements, and results were discussed. | - |
dc.language | English | - |
dc.publisher | WILEY-V C H VERLAG GMBH | - |
dc.subject | INTERBAND CRITICAL-POINTS | - |
dc.subject | OPTICAL-CONSTANTS | - |
dc.subject | DIELECTRIC FUNCTION | - |
dc.subject | TEMPERATURE-DEPENDENCE | - |
dc.subject | TERNARY ALLOYS | - |
dc.subject | CD1-XZNXTE | - |
dc.subject | CADMIUM | - |
dc.subject | REFLECTIVITY | - |
dc.subject | PARAMETERS | - |
dc.subject | SILICON | - |
dc.title | Spectroscopic ellipsometry studies on polycrystalline Cd0.9Zn0.1Te thin films | - |
dc.type | Article | - |
dc.identifier.wosid | 000220616600028 | - |
dc.identifier.scopusid | 2-s2.0-1942538611 | - |
dc.type.rims | ART | - |
dc.citation.volume | 201 | - |
dc.citation.beginningpage | 782 | - |
dc.citation.endingpage | 790 | - |
dc.citation.publicationname | PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | - |
dc.identifier.doi | 10.1002/pssa.200306714 | - |
dc.contributor.localauthor | Lee, Hee Chul | - |
dc.contributor.nonIdAuthor | Sridharan, MG | - |
dc.contributor.nonIdAuthor | Mekaladevi, M | - |
dc.contributor.nonIdAuthor | Rodriguez-Viejo, J | - |
dc.contributor.nonIdAuthor | Narayandass, SK | - |
dc.contributor.nonIdAuthor | Mangalaraj, D | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordPlus | INTERBAND CRITICAL-POINTS | - |
dc.subject.keywordPlus | OPTICAL-CONSTANTS | - |
dc.subject.keywordPlus | DIELECTRIC FUNCTION | - |
dc.subject.keywordPlus | TEMPERATURE-DEPENDENCE | - |
dc.subject.keywordPlus | TERNARY ALLOYS | - |
dc.subject.keywordPlus | CD1-XZNXTE | - |
dc.subject.keywordPlus | CADMIUM | - |
dc.subject.keywordPlus | REFLECTIVITY | - |
dc.subject.keywordPlus | PARAMETERS | - |
dc.subject.keywordPlus | SILICON | - |
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