Volumetric phase-measuring interferometer for three-dimensional coordinate metrology

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dc.contributor.authorKim, Seung-Wooko
dc.contributor.authorRhee, H.-G.ko
dc.contributor.authorChu, J.-Y.ko
dc.date.accessioned2013-03-05T02:19:32Z-
dc.date.available2013-03-05T02:19:32Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2003-
dc.identifier.citationPRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY, v.27, no.2, pp.205 - 215-
dc.identifier.issn0141-6359-
dc.identifier.urihttp://hdl.handle.net/10203/85009-
dc.description.abstractWe present a volumetric interferometer that has been specially designed to improve the measurement accuracy of the three-dimensional coordinate metrology by reducing excessive Abbe offsets. The interferometer is composed of two main parts; one is a three-dimensionally movable target and the other is a stationary two-dimensional array of photo-detectors. The target made of point diffraction sources emanates two spherical wavefronts, of which interference intensity is monitored by the photo-detectors. Applying phase shifting allows the phases of the photo-detectors to be precisely obtained, and the measured phases are fitted to a geometric model of multilateration so as to determine the xyz-location of the target by minimizing least square errors. A prototype built on a CMM demonstrates that the proposed interferometer is capable of measuring the xyz-coordinates of the probe with a volumetric uncertainty of less than 1.0 mum. (C) 2002 Elsevier Science Inc. All rights reserved.-
dc.languageEnglish-
dc.publisherELSEVIER SCIENCE INC-
dc.subjectSHIFTING INTERFEROMETRY-
dc.subjectALGORITHM-
dc.titleVolumetric phase-measuring interferometer for three-dimensional coordinate metrology-
dc.typeArticle-
dc.identifier.wosid000182335000012-
dc.identifier.scopusid2-s2.0-0037377531-
dc.type.rimsART-
dc.citation.volume27-
dc.citation.issue2-
dc.citation.beginningpage205-
dc.citation.endingpage215-
dc.citation.publicationnamePRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY-
dc.identifier.doi10.1016/S0141-6359(02)00228-3-
dc.contributor.localauthorKim, Seung-Woo-
dc.contributor.nonIdAuthorRhee, H.-G.-
dc.contributor.nonIdAuthorChu, J.-Y.-
dc.type.journalArticleArticle-
dc.subject.keywordAuthorvolumetric interferometer-
dc.subject.keywordAuthorphase measuring interferometry-
dc.subject.keywordAuthorcoordinatemetrology-
dc.subject.keywordAuthormultilateration-
dc.subject.keywordAuthorabbe offset-
dc.subject.keywordPlusSHIFTING INTERFEROMETRY-
dc.subject.keywordPlusALGORITHM-
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