Growth properties and critical current measurements of Sm1+xBa2-xCu3O7-delta films on biaxially textured Ni tapes

Abstract

The growth properties and field dependent critical current densities of Sm1+xBa2-xCu3O7-delta (SBCO) films on biaxially textured Ni tapes with CeO2/YSZ/CeO2 buffer layers were investigated. The window of substrate temperature (T-s) for c-axis normal growth in 5 mTorr of oxygen pressure were wider than 150 degreesC. The upper limit of T-s-window was much higher than that of Y1Ba2Cu3O7-delta (YBCO) films. Around the lower limit of T-s, SBCO films grew in [103] normal textures. The zero field critical currents (J(c)) were similar to6 times smaller than those of YBCO films, while the estimated pinning energies were less dependent on external fields than that of YBCO. (C) 2002 Elsevier Science B.V. All rights reserved.