DC Field | Value | Language |
---|---|---|
dc.contributor.author | Mai, L | ko |
dc.contributor.author | Kim, DH | ko |
dc.contributor.author | Yim, M | ko |
dc.contributor.author | Yoon, Giwan | ko |
dc.date.accessioned | 2013-03-04T13:02:53Z | - |
dc.date.available | 2013-03-04T13:02:53Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2004-09 | - |
dc.identifier.citation | MICROWAVE AND OPTICAL TECHNOLOGY LETTERS, v.42, pp.505 - 507 | - |
dc.identifier.issn | 0895-2477 | - |
dc.identifier.uri | http://hdl.handle.net/10203/82722 | - |
dc.description.abstract | We present a feasibility study of ZnO-based FBAR devices and their fabrications for the ultra-mass-sensitive sensor application. In this work, a considerable shift in the resonance frequency is observed due to the mass-loading effect by a mixture of ink and volatile methanol. A high sensitivity of 0.05 x 10(5) Hz (.) cm(2)/ng is obtained in the FBAR-based device, which is similar to5 orders of magnitude higher than that of 0.057 Hz (.) cm(2)/ng reported in the conventional 5-MHz quartz crystal microbalance. This approach seems useful for the ultra-high-mass resolution chemical sensor or biosensor applications. (C) 2004 Wiley Periodicals, Inc. | - |
dc.language | English | - |
dc.publisher | JOHN WILEY & SONS INC | - |
dc.title | A feasibility study of ZnO-based FBAR devices for an ultra-mass-sensitive sensor application | - |
dc.type | Article | - |
dc.identifier.wosid | 000223312900024 | - |
dc.identifier.scopusid | 2-s2.0-4444356475 | - |
dc.type.rims | ART | - |
dc.citation.volume | 42 | - |
dc.citation.beginningpage | 505 | - |
dc.citation.endingpage | 507 | - |
dc.citation.publicationname | MICROWAVE AND OPTICAL TECHNOLOGY LETTERS | - |
dc.identifier.doi | 10.1002/mop.20351 | - |
dc.contributor.localauthor | Yoon, Giwan | - |
dc.contributor.nonIdAuthor | Mai, L | - |
dc.contributor.nonIdAuthor | Kim, DH | - |
dc.contributor.nonIdAuthor | Yim, M | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordAuthor | FBAR devices | - |
dc.subject.keywordAuthor | ZnO | - |
dc.subject.keywordAuthor | resonance characteristics | - |
dc.subject.keywordAuthor | Q-factor | - |
dc.subject.keywordAuthor | return loss | - |
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