RF-Sputtered Vanadium Oxide Thin Films : Effect of OxygenPartial Pressure on Structural and Electrochemical Properties

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dc.contributor.author박신종ko
dc.date.accessioned2013-03-04T08:52:57Z-
dc.date.available2013-03-04T08:52:57Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2001-09-
dc.identifier.citationBULLETIN OF THE KOREAN CHEMICAL SOCIETY, v.22, no.9, pp.1015 - 1018-
dc.identifier.issn0253-2964-
dc.identifier.urihttp://hdl.handle.net/10203/82238-
dc.languageKorean-
dc.publisher대한화학회-
dc.titleRF-Sputtered Vanadium Oxide Thin Films : Effect of OxygenPartial Pressure on Structural and Electrochemical Properties-
dc.typeArticle-
dc.type.rimsART-
dc.citation.volume22-
dc.citation.issue9-
dc.citation.beginningpage1015-
dc.citation.endingpage1018-
dc.citation.publicationnameBULLETIN OF THE KOREAN CHEMICAL SOCIETY-
dc.contributor.localauthor박신종-
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