Electromagnetic scattering from a thick circular aperture
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Lee, HS | ko |
| dc.contributor.author | Eom, Hyo Joon | ko |
| dc.date.accessioned | 2013-03-04T01:52:45Z | - |
| dc.date.available | 2013-03-04T01:52:45Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2003-02 | - |
| dc.identifier.citation | MICROWAVE AND OPTICAL TECHNOLOGY LETTERS, v.36, no.3, pp.228 - 231 | - |
| dc.identifier.issn | 0895-2477 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/81381 | - |
| dc.description.abstract | Electromagnetic scattering from a circular aperture ill a thick conducting plane is analyzed. Numerical computations art, performed to evaluate the near and far zone radiation fields in terms of the aperture geometry and incident polarization state. A salient difference in the near-zone field behavior between TM and TE wave incidences is discussed. (C) 2003 Wiley Periodicals. Inc. | - |
| dc.language | English | - |
| dc.publisher | JOHN WILEY SONS INC | - |
| dc.title | Electromagnetic scattering from a thick circular aperture | - |
| dc.type | Article | - |
| dc.identifier.wosid | 000180752100025 | - |
| dc.identifier.scopusid | 2-s2.0-0037419991 | - |
| dc.type.rims | ART | - |
| dc.citation.volume | 36 | - |
| dc.citation.issue | 3 | - |
| dc.citation.beginningpage | 228 | - |
| dc.citation.endingpage | 231 | - |
| dc.citation.publicationname | MICROWAVE AND OPTICAL TECHNOLOGY LETTERS | - |
| dc.contributor.localauthor | Eom, Hyo Joon | - |
| dc.contributor.nonIdAuthor | Lee, HS | - |
| dc.type.journalArticle | Article | - |
| dc.subject.keywordAuthor | electromagnetic scattering | - |
| dc.subject.keywordAuthor | circular aperture | - |
| dc.subject.keywordAuthor | near fields | - |
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