Digital-to-analog converter using single-electron tunnel junctions

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dc.contributor.authorShin, Mincheolko
dc.contributor.authorChoi, JBko
dc.date.accessioned2013-03-04T00:13:01Z-
dc.date.available2013-03-04T00:13:01Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2004-05-
dc.identifier.citationJAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, v.43, no.5A, pp.2795 - 2796-
dc.identifier.urihttp://hdl.handle.net/10203/81014-
dc.description.abstractWe have devised a novel digital-to-analog converter (DAC) based on parallel-coupled single-electron tunnel junctions and demonstrated its functionality by performing simulation studies of a 3-bit DAC. The main features of the single-electron DAC are its ease of expansion due to its relatively simple structure and robust-to-background-charge property due to the parallel coupling of single-electron tunnel junctions.-
dc.languageEnglish-
dc.publisherINST PURE APPLIED PHYSICS-
dc.subjectLOGIC-
dc.titleDigital-to-analog converter using single-electron tunnel junctions-
dc.typeArticle-
dc.identifier.wosid000221703600088-
dc.identifier.scopusid2-s2.0-3142780009-
dc.type.rimsART-
dc.citation.volume43-
dc.citation.issue5A-
dc.citation.beginningpage2795-
dc.citation.endingpage2796-
dc.citation.publicationnameJAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS-
dc.identifier.doi10.1143/JJAP.43.2795-
dc.contributor.localauthorShin, Mincheol-
dc.contributor.nonIdAuthorChoi, JB-
dc.type.journalArticleArticle-
dc.subject.keywordAuthorsingle-electron tunneling-
dc.subject.keywordAuthordigital-to-analog converter-
dc.subject.keywordAuthornano-device-
dc.subject.keywordPlusLOGIC-
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