Extraction of Channel Thermal Noise for Deep-Submicron NMOSFETs
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | kwangseok han | ko |
| dc.contributor.author | hyungcheol shin | ko |
| dc.date.accessioned | 2013-03-03T21:42:56Z | - |
| dc.date.available | 2013-03-03T21:42:56Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2002-10 | - |
| dc.identifier.citation | JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.41, no.4, pp.501 - 504 | - |
| dc.identifier.issn | 3744-4884 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/80567 | - |
| dc.language | Korean | - |
| dc.publisher | 한국물리학회 | - |
| dc.title | Extraction of Channel Thermal Noise for Deep-Submicron NMOSFETs | - |
| dc.type | Article | - |
| dc.type.rims | ART | - |
| dc.citation.volume | 41 | - |
| dc.citation.issue | 4 | - |
| dc.citation.beginningpage | 501 | - |
| dc.citation.endingpage | 504 | - |
| dc.citation.publicationname | JOURNAL OF THE KOREAN PHYSICAL SOCIETY | - |
| dc.contributor.localauthor | hyungcheol shin | - |
| dc.contributor.nonIdAuthor | kwangseok han | - |
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