Browse "School of Computing(전산학부)" by Author Kim, Taeksu
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| Automated Unit Testing of Large Industrial Embedded Software Using Concolic Testing Kim, Yunho; Kim, Youil; Kim, Taeksu; Lee, Gunwoo; Jang, Yoonkyu; Kim, Moonzoo, 28th IEEE/ACM International Conference on Automated Software Engineering (ASE), pp.519 - 528, IEEE Computer Society and ACM SIGSFOT, 2013-11-14 |
| Classifying False Positive Static Checker Alarms in Continuous Integration Using Convolutional Neural Networks Lee, Seongmin; Hong, Shin; Yi, Jungbae; Kim, Taeksu; Kim, Chul-Joo; Yoo, Shin, 2019 12th IEEE Conference on Software Testing, Validation and Verification (ICST), pp.391 - 401, IEEE, 2019-04-26 |
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