Browse "School of Computing(전산학부)" by Author Ahn, Jaemin
Showing results 1 to 3 of 3
| Are concurrency coverage metrics effective for testing: a comprehensive empirical investigation Hong, Shin; Staats, Matt; Ahn, Jaemin; Kim, Moonzoo; Rothermel, Gregg, SOFTWARE TESTING VERIFICATION & RELIABILITY, v.25, no.4, pp.334 - 370, 2015-06 |
| Testing Concurrent Programs to Achieve High Synchronization Coverage Hong, Shin; Ahn, Jaemin; Park, Sangmin; Kim, Moonzoo; Harrold, Mary-Jean, International Symposium on Software Testing and Analysis, ACM, 2012-07-18 |
| The Impact of Concurrent Coverage Metrics on Testing Effectiveness Hong, Shin; Staats, Matthew; Ahn, Jaemin; Kim, Moonzoo; Rothermel, Gregg, International Conference on Software Testing, Verification and Validation (ICST), IEEE, 2013-03-20 |
Discover
Open Access
- 187 OA Article
Date issued
- 1,745 2020 - 2024
- 5,391 2010 - 2019
- 4,587 2000 - 2009
- 2,927 1990 - 1999
- 839 1980 - 1989