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AMID: Approximation of MultI-measured Data using SVD Min, Jun-Ki; Lee, Chun-Hee; Chung, Chin-Wan, INFORMATION SCIENCES, v.179, no.16, pp.2833 - 2850, 2009-07 |
An effective approach to improve the performance of eCPDP (early cross-project defect prediction) via data-transformation and parameter optimization Kwon, Sunjae; Ryu, Duksan; Baik, Jongmoon, SOFTWARE QUALITY JOURNAL, v.31, no.4, pp.1009 - 1044, 2023-12 |
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