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A Practically Efficient Algorithm for Mask Pattern Verification Based on Improved Bucket Technique Lee, HC; Shin, Sung-Yong; Jung, JC; Cha, HK; Yun, YS; Lee, CD, Proc. Tech. conference on computer Graphics and Design Automation, pp.61 - 67, 1989 |
An Efficient Sequential Range Query Model for Minimum Width/Space Verification Jeong, J.C; Shin, Sung-Yong; Lee, CD; Yu, Y.U., Proc. IEEE Int'l Conf. on Computer-Aided Design(ICCAD 88), pp.330 - 335, 1988-11 |
CGI Standard and Implementation fo a Grphics Package on PC's Lee, WW; Lee, SJ; Choi, KI; Baek, NH; Shin, Sung-Yong; Kim, HM; Lee, CD, Proc. Tech. conference on computer Graphics and Design Automation, pp.1 - 6, 1989 |
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