Browse "School of Computing(전산학부)" by Author Baek, Haeun

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Comparison of Software Product Line Test Derivation Methods from the Reuse Viewpoint

Kang, Sungwon; Kim, Jungmin; Baek, Haeun; Ahn, Hwi; jung, pilsu; Lee, Jihyun, The 6th International Conference on Software and Computer Applications (ICSCA 2017), ICPS, 2017-02

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