Browse "School of Computing(전산학부)" by Author Baek, Hae Un
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| Systematic Software Product Line Test Case Derivation for Test Data Reuse Kang, Sung Won; Baek, Hae Un; Kim, Jung Min; Lee, Ji Hyun, 2015 IEEE 39th Annual Computer Software and Applications Conference (COMPSAC), pp.433 - 440, IEEE, 2015-07-01 |
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