Showing results 1 to 1 of 1
A Practically Efficient Algorithm for Mask Pattern Verification Based on Improved Bucket Technique Lee, HC; Shin, Sung-Yong; Jung, JC; Cha, HK; Yun, YS; Lee, CD, Proc. Tech. conference on computer Graphics and Design Automation, pp.61 - 67, 1989 |
Discover