Browse "School of Computing(전산학부)" by Author Poulding, Simon

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Test Set Diameter: Quantifying the Diversity of Sets of Test Cases

Feldt, Robert; Poulding, Simon; Clark, David; Yoo, Shin, 9th IEEE International Conference on Software Testing, Verification and Validation, ICST 2016, pp.223 - 233, Institute of Electrical and Electronics Engineers Inc., 2016-04-14

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