Showing results 1 to 1 of 1
Ask the Mutants: Mutation Faulty Programs for Fault Localization Moon, Seokhyun; Kim, Yoonho; Kim, Moonzoo; Yoo, Shin, International Conference on Software Testing, Verification and Validation (ICST), pp.153 - 162, IEEE Computer Society, 2014-04-02 |
Discover