Growth of textured c-axis normal Y1Ba2Cu3O7-delta thin films on yttria-stabilized zirconia substrates with crystalline axes tilted with respect to the surfaces

Abstract

Well textured c-axis normal Y1Ba2Cu3O7-delta (YBCO) thin films on yttria-stabilized zirconia(YSZ) substrates whose crystalline axes are tilted by 45 degrees, 30 degrees, 20 degrees, 10 degrees, 0 degrees (untilted) with respect to the surfaces have been fabricated using dc-sputtering. CeO2 buffer layers of the same thickness, 15 Angstrom, were deposited on all substrates prior to YBCO deposition. For untilted crystalline YSZ substrate, an oxygen ion milling pretreatment on its surface is necessary. Microscopic effects of the ion milling were investigated by X-ray photoelectron spectroscopy and atomic force microscope. The crystalline qualities of the YBCO films were investigated by X-ray diffraction 2 theta and phi-scan measurements. For all films, the measured zero resistance temperatures (T-c's) and critical current densities (J(c)'s) were 84-85 K and above 10(6) A/cm(2) at 77 K, respectively.