A well textured YBCO thin film was grown on a 8000 Angstrom thick Pt tape with a STO buffer layer. In order to obtain the tape, a multilayer STO/Pt/STO/BaO was deposited on a YSZ(100) substrate and then the STO/Pt/STO layer was separated from the substrate by solving the BaO layer in water. A YBCO film was deposited on the STO/Pt/STO tape. It was confirmed by XRD 2 theta-scan and phi-scan measurements that the single crystalline Pt layer, the single crystalline STO buffer layer, and the well textured c-axis normal YBCO film were grown. The R-T measurement showed T-c was 79K.