LBIC(Laser Beam Induced Current) 측정을 이용한 HgCdTe Diode의 특성 연구
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Lee, Hee-Chul | ko |
| dc.contributor.author | 배수호 | ko |
| dc.contributor.author | 김영호 | ko |
| dc.contributor.author | 김충기 | ko |
| dc.date.accessioned | 2013-03-02T12:21:58Z | - |
| dc.date.available | 2013-03-02T12:21:58Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1999-12 | - |
| dc.identifier.citation | 응용물리, v.12, no.0, pp.42 - 46 | - |
| dc.identifier.issn | 1013-7009 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/73500 | - |
| dc.language | Korean | - |
| dc.publisher | 한국물리학회 | - |
| dc.title | LBIC(Laser Beam Induced Current) 측정을 이용한 HgCdTe Diode의 특성 연구 | - |
| dc.type | Article | - |
| dc.type.rims | ART | - |
| dc.citation.volume | 12 | - |
| dc.citation.issue | 0 | - |
| dc.citation.beginningpage | 42 | - |
| dc.citation.endingpage | 46 | - |
| dc.citation.publicationname | 응용물리 | - |
| dc.contributor.localauthor | Lee, Hee-Chul | - |
| dc.contributor.nonIdAuthor | 배수호 | - |
| dc.contributor.nonIdAuthor | 김영호 | - |
| dc.contributor.nonIdAuthor | 김충기 | - |
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